Public service evidence
Texas Materials Institute (TMI)
Texas Materials Institute (TMI) at The University of Texas at Austin provides shared-facility access for x-ray and synchrotron characterization, electron microscopy, surface and thin-film characterization, and polymer analysis. Registration, training, project review, fees, and current instrument availability may apply.
External services publicly offered
Publicly described capabilities
Advanced characterization
X-ray and synchrotron characterization
Advanced characterization
Electron microscopy
Advanced characterization
Surface and thin-film characterization
Materials testing
Polymer analysis
Materials testing
Materials characterization
Explore the equipment
Instrument models
CAD illustrations show the instrument model. Confirm the installed configuration and current availability with the lab.
Model illustrationOther laboratory / process equipment
Rigaku MiniFlex 600
Equipment evidence
Rigaku MiniFlex 600 systems support phase identification, crystallinity, crystallite size and crystal-structure determination; one has an automated six-position spinner.
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Techniques and equipment
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X-ray & neutron
X-ray scattering instrument
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Microscopy & imaging
electron microscope
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Laboratory equipment
polymer characterization instrument
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Laboratory equipment
spectrometer
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Surface analysis
surface analysis instrument
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Thermal & mechanical
thermal analyzer
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Laboratory equipment
JEOL NEOARM low-kV corrected STEM is assigned to EER 6.644.
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Spectroscopy
Mettler TGA/DSC 1 supports polymer thermal analysis; Bruker Invenio R supports FTIR analysis.
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Micro/nanofabrication
Oxford PlasmaLab 80+ PECVD/etch, March CS170IF RIE and Samco RIE-1C support cleanroom deposition and etching.
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Laboratory equipment
Rigaku MiniFlex 600 systems support phase identification, crystallinity, crystallite size and crystal-structure determination; one has an automated six-position spinner.
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X-ray & neutron
Rigaku ULTIMA IV and Scintag X1 diffractometers plus SAXSLabs Ganesha are listed in EER 6.640 for XRD/SAXS.
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Microscopy & imaging
Thermo Fisher Scios 2 HiVac dual-beam FIB/SEM with electron-beam-lithography capability is assigned to EER 0.756.
Registry scope evidence
- ◇External access: TMI offers more than 100 instruments to internal, corporate and external users..
- ◇Capabilities: TNF describes TMI microscopy and surface characterization including TEM/STEM, TOF-SIMS, XPS, AES and Raman..
- ◇Capabilities: TMI publishes polymer characterization, spectroscopy and SAXS instrument services with external rates..
- ◇Official-source, facility-specific instrument evidence is available. Current configuration, availability, price, and project fit require confirmation.
Evidence used for this listing
Vicena compiles these public listings from cited laboratory sources. A listing does not imply a partnership, current availability, pricing, or acceptance of a project. This profile is not an endorsement, availability check, quote, or representation of a commercial relationship.